JPH0225234Y2 - - Google Patents
Info
- Publication number
- JPH0225234Y2 JPH0225234Y2 JP5795284U JP5795284U JPH0225234Y2 JP H0225234 Y2 JPH0225234 Y2 JP H0225234Y2 JP 5795284 U JP5795284 U JP 5795284U JP 5795284 U JP5795284 U JP 5795284U JP H0225234 Y2 JPH0225234 Y2 JP H0225234Y2
- Authority
- JP
- Japan
- Prior art keywords
- wiring
- external connection
- probe
- connection terminal
- front side
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 78
- 239000000758 substrate Substances 0.000 claims description 29
- 230000007423 decrease Effects 0.000 claims 1
- 230000000149 penetrating effect Effects 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 description 11
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 229920003002 synthetic resin Polymers 0.000 description 6
- 239000000057 synthetic resin Substances 0.000 description 6
- 238000005259 measurement Methods 0.000 description 4
- 238000005476 soldering Methods 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- -1 for example Inorganic materials 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5795284U JPS60174246U (ja) | 1984-04-20 | 1984-04-20 | プロ−ブカ−ド |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5795284U JPS60174246U (ja) | 1984-04-20 | 1984-04-20 | プロ−ブカ−ド |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60174246U JPS60174246U (ja) | 1985-11-19 |
| JPH0225234Y2 true JPH0225234Y2 (en]) | 1990-07-11 |
Family
ID=30582981
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5795284U Granted JPS60174246U (ja) | 1984-04-20 | 1984-04-20 | プロ−ブカ−ド |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60174246U (en]) |
-
1984
- 1984-04-20 JP JP5795284U patent/JPS60174246U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60174246U (ja) | 1985-11-19 |
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